Proposing a Solution for Single-Event Upset in 1T1R RRAM Memory Arrays

2018 ◽  
Vol 65 (6) ◽  
pp. 1239-1247 ◽  
Author(s):  
Amr M. S. Tosson ◽  
Shimeng Yu ◽  
Mohab H. Anis ◽  
Lan Wei
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Memory Arrays

Single Event Upset in FG memory arrays - Prompt and permanent data corruption in modern and future technologies

2007 ◽  
Author(s):  
Giorgio Cellere ◽  
Alessandro Paccagnella ◽  
Reno Harboe-Sorensen ◽  
Angelo Visconti ◽  
Mauro Bonanomi ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Data Corruption ◽  
Memory Arrays ◽  
Future Technologies

SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm

Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy
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