SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event

Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path

2016 ◽  
Vol E99.A (6) ◽  
pp. 1198-1205
Author(s):  
Go MATSUKAWA ◽  
Yuta KIMI ◽  
Shuhei YOSHIDA ◽  
Shintaro IZUMI ◽  
Hiroshi KAWAGUCHI ◽  
...  
Keyword(s):  
Error Propagation ◽  
Single Event Upset ◽  
Single Event ◽  
Propagation Analysis ◽  
Error Propagation Analysis

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm

Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy

Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser

1994 ◽  
Vol 41 (6) ◽  
pp. 2195-2202 ◽  
Author(s):  
S. Buchner ◽  
J.B. Langworthy ◽  
W.J. Stapor ◽  
A.B. Campbell ◽  
S. Rivet
Keyword(s):  
Spatial Dependence ◽  
Pulsed Laser ◽  
Single Event Upset ◽  
Single Event
Sign in / Sign up

Export Citation Format

Share Document