Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy

scholarly journals Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

2007 ◽  
Vol 54 (6) ◽  
pp. 2303-2311 ◽  
Author(s):  
P. E. Dodd ◽  
J. R. Schwank ◽  
M. R. Shaneyfelt ◽  
J. A. Felix ◽  
P. Paillet ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy ◽  
Nuclear Interactions

Dependence of Temperature and Back-gate Bias on Single Event Upset Induced by Heavy Ion in a 0.2 μm DSOI CMOS Technology

2021 ◽  
pp. 1-1
Author(s):  
Yuchong Wang ◽  
Fanyu Liu ◽  
Bo Li ◽  
Binhong Li ◽  
Yang Huang ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
Gate Bias ◽  
Single Event Upset ◽  
Single Event ◽  
Back Gate

Simulation of Thermal-Neutron-Induced Single-Event Upset Using Particle and Heavy-Ion Transport Code System

2007 ◽  
Vol 46 (6A) ◽  
pp. 3377-3379
Author(s):  
Yutaka Arita ◽  
Koji Niita ◽  
Yuji Kihara ◽  
Junich Mitsuhasi ◽  
Mikio Takai ◽  
...  
Keyword(s):  
Ion Transport ◽  
Thermal Neutron ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Code System ◽  
Transport Code

Impact of ion energy on single-event upset

1998 ◽  
Vol 45 (6) ◽  
pp. 2483-2491 ◽  
Author(s):  
P.E. Dodd ◽  
O. Musseau ◽  
M.R. Shaneyfelt ◽  
F.W. Sexton ◽  
C. D'hose ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Ion Energy

The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs

2018 ◽  
Vol 65 (5) ◽  
pp. 1091-1100 ◽  
Author(s):  
Song Gu ◽  
Jie Liu ◽  
Jinshun Bi ◽  
Fazhan Zhao ◽  
Zhangang Zhang ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Ion Energy ◽  
Single Event Upsets

scholarly journals Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Symmetry ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 2030
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Tao Liu ◽  
You-Mei Sun ◽  
Jie Liu
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
Low Energy ◽  
Single Event Upset ◽  
Single Event ◽  
High Energy Proton ◽  
Orbital Parameters ◽  
Energy Proton ◽  
Orbital Height ◽  
Selection Of

The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.

Further development of the Heavy Ion Cross section for single event UPset: model (HICUP)

1995 ◽  
Vol 42 (6) ◽  
pp. 2026-2034 ◽  
Author(s):  
L.W. Connell ◽  
F.W. Sexton ◽  
A.K. Prinja
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Further Development

Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

1996 ◽  
Vol 43 (6) ◽  
pp. 2814-2819 ◽  
Author(s):  
L.W. Connell ◽  
F.W. Sexton ◽  
P.J. McDaniel ◽  
A.K. Prinja
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Track Structure ◽  
Single Event Upset ◽  
Single Event

Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

2009 ◽  
Vol 56 (6) ◽  
pp. 3130-3137 ◽  
Author(s):  
Kevin M. Warren ◽  
Andrew L. Sternberg ◽  
Jeffrey D. Black ◽  
Robert A. Weller ◽  
Robert A. Reed ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Flip Flop ◽  
Rate Prediction

scholarly journals Impact of recombination on heavy ion induced single event upset cross-section

2016 ◽  
Vol 151 ◽  
pp. 012040
Author(s):  
K S Zemtsov ◽  
A M Galimov ◽  
M E Gorchichko ◽  
I V Elushov
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event
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