Random Test Generation With Input Cube Avoidance

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2001943 ◽

2009 ◽

Vol 17 (1) ◽

pp. 45-54 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

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3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658037 ◽

2005 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Test Set ◽

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Merit based directed random test generation (MDRTG) scheme for combinational circuits

2010 East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2010.5742157 ◽

2010 ◽

Author(s):

Arezoo Kamran ◽

Mohammad Saeed Jahangiry ◽

Zainalabedin Navabi

Keyword(s):

Test Generation ◽

Combinational Circuits ◽

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Near optimal machine learning based random test generation

2010 East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2010.5742082 ◽

2010 ◽

Author(s):

Niki Shakeri ◽

Nastaran Nemati ◽

Majid Nili Ahmadabadi ◽

Zainalabedin Navabi

Keyword(s):

Machine Learning ◽

Test Generation ◽

Random Test ◽

Optimal Machine

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An SPU reference model for simulation, random test generation and verification

Asia and South Pacific Conference on Design Automation, 2006. ◽

10.1145/1118299.1118495 ◽

2006 ◽

Author(s):

Yukio Watanabe ◽

Balazs Sallay ◽

Brad Michael ◽

Daniel Brokenshire ◽

Gavin Meil ◽

...

Keyword(s):

Test Generation ◽

Reference Model ◽

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Feedback-Directed Random Test Generation

29th International Conference on Software Engineering (ICSE'07) ◽

10.1109/icse.2007.37 ◽

2007 ◽

Author(s):

Carlos Pacheco ◽

Shuvendu K. Lahiri ◽

Michael D. Ernst ◽

Thomas Ball

Keyword(s):

Test Generation ◽

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Random Test Generation from Regular Expressions for Graphical User Interface (GUI) Testing

2019 IEEE 19th International Conference on Software Quality, Reliability and Security Companion (QRS-C) ◽

10.1109/qrs-c.2019.00044 ◽

2019 ◽

Author(s):

Onur Kilincceker ◽

Alper Silistre ◽

Moharram Challenger ◽

Fevzi Belli

Keyword(s):

User Interface ◽

Graphical User Interface ◽

Test Generation ◽

Regular Expressions ◽

Random Test ◽

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Guiding Random Test Generation for Intra-class Dataflow Coverage

2014 16th International Symposium on Symbolic and Numeric Algorithms for Scientific Computing ◽

10.1109/synasc.2014.28 ◽

2014 ◽

Author(s):

Petru Florin Mihancea ◽

Edit Mercedes Mera-Batiz ◽

Marius Minea

Keyword(s):

Test Generation ◽

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Functional versus random test generation for sequential circuits

Journal of Electronic Testing ◽

10.1007/bf00971938 ◽

1993 ◽

Vol 4 (1) ◽

pp. 33-41 ◽

Author(s):

Margot Karam ◽

Gabriele Saucier

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Functional Versus ◽

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Pseudo-random test generation for large combinational circuits

Journal of Computer Science and Technology ◽

10.1007/bf02946162 ◽

1992 ◽

Vol 7 (1) ◽

pp. 19-28 ◽

Author(s):

Zhongcheng Li ◽

Yinghua Min

Keyword(s):

Test Generation ◽

Combinational Circuits ◽

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An SPU reference model for simulation, random test generation and verification

Asia and South Pacific Conference on Design Automation, 2006. ◽

10.1109/aspdac.2006.1594794 ◽

2006 ◽

Author(s):

Y. Watanabe ◽

B. Sallay ◽

B. Michael ◽

D. Hiraoka ◽

D. Brokenshire ◽

...

Keyword(s):

Test Generation ◽

Reference Model ◽

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