Merit based directed random test generation (MDRTG) scheme for combinational circuits

Author(s):  
Arezoo Kamran ◽  
Mohammad Saeed Jahangiry ◽  
Zainalabedin Navabi
Author(s):  
Seyyede Maryam Ghasemy ◽  
Maryam Rajabalipanah ◽  
Saeideh Sarmadi ◽  
Zainalabedin Navabi

2002 ◽  
Vol 42 (7) ◽  
pp. 1141-1149 ◽  
Author(s):  
T Cibáková ◽  
M Fischerová ◽  
E Gramatová ◽  
W Kuzmicz ◽  
W.A Pleskacz ◽  
...  

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