Parametric yield enhancement system via circuit level device optimization using statistical circuit simulation

Author(s):  
M. Miyama ◽  
S. Kamohara ◽  
K. Okuyama ◽  
Y. Oji
2012 ◽  
Vol 17 (3) ◽  
pp. 1-20 ◽  
Author(s):  
Chien-Nan Jimmy Liu ◽  
Yen-Lung Chen ◽  
Chin-Cheng Kuo ◽  
I-Ching Tsai

2018 ◽  
Author(s):  
José Carlos Pedro ◽  
David E. Root ◽  
Jianjun Xu ◽  
Luís Cótimos Nunes

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