Technology trend of flash-EEPROM-Can flash-EEPROM overcome DRAM?

Author(s):  
F. Masuoka
Keyword(s):  
2019 ◽  
Vol 73 (10) ◽  
pp. 944-948
Author(s):  
Jari Almi ◽  
Samuli Lehtonen ◽  
Kenichi Ishihara

Author(s):  
Camelia Hora ◽  
Stefan Eichenberger

Abstract Due to the development of smaller and denser manufacturing processes most of the hardware localization techniques cannot keep up satisfactorily with the technology trend. There is an increased need in precise and accurate software based diagnosis tools to help identify the fault location. This paper describes the software based fault diagnosis method used within Philips, focusing on the features developed to increase its accuracy.


Author(s):  
Min-Jee Kim ◽  
Changyeun Mo ◽  
Hyeon Tae Kim ◽  
Byoung-Kwan Cho ◽  
Soon-Jung Hong ◽  
...  

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