High‐Precision Measurement of 187 Os/ 188 Os Isotope Ratios of Nanogram to Picogram Amounts of Os in Geological Samples by N‐ TIMS using Faraday Cups Equipped with 10 13 Ω Amplifiers

2019 ◽  
Vol 43 (3) ◽  
pp. 419-433 ◽  
Author(s):  
Guiqin Wang ◽  
Hauke Vollstaedt ◽  
Jifeng Xu ◽  
Wengui Liu
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
Isotope Ratios ◽  
Geological Samples ◽  
High Precision Measurement ◽  
Os Isotope

High-precision measurement of chlorine stable isotope ratios

1993 ◽  
Vol 57 (12) ◽  
pp. 2907-2912 ◽  
Author(s):  
Austin Long ◽  
christopher J Eastoe ◽  
Ronald S Kaufmann ◽  
Jennifer G Martin ◽  
Laurie Wirt ◽  
...  
Keyword(s):  
Stable Isotope ◽  
High Precision ◽  
Precision Measurement ◽  
Isotope Ratios ◽  
Stable Isotope Ratios ◽  
High Precision Measurement ◽  
Chlorine Stable Isotope

High-precision measurement of U-Pu-Np-Am concentrations and isotope ratios in environmental reference materials by mass spectrometry

2021 ◽  
Vol 237 ◽  
pp. 106689
Author(s):  
Steven J. Goldstein ◽  
Allison A. Price ◽  
Kimberly A. Hinrichs ◽  
Stephen P. Lamont ◽  
Andrew J. Nunn ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Reference Materials ◽  
Precision Measurement ◽  
Isotope Ratios ◽  
High Precision Measurement ◽  
Environmental Reference

High-precision cerium isotope analysis by thermal ionization mass spectrometry using the Ce+ technique

2020 ◽  
Vol 35 (3) ◽  
pp. 467-477 ◽  
Author(s):  
Xuepeng Shao ◽  
Wenting Bu ◽  
Yichen Fan ◽  
Kaiming Long ◽  
Hongmei Yang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Precision Measurement ◽  
Thermal Ionization Mass Spectrometry ◽  
Isotope Analysis ◽  
New Method ◽  
Ionization Mass ◽  
Geological Samples ◽  
High Precision Measurement ◽  
Thermal Ionization Mass

A new method is presented for high-precision measurement of cerium isotope ratios in geological samples by TIMS with the Ce+ technique.

High precision measurement of the SOS surface thickness in the rough phase

1991 ◽  
Vol 1 (12) ◽  
pp. 1669-1673 ◽  
Author(s):  
Hans Gerd Evertz ◽  
Martin Hasenbusch ◽  
Mihail Marcu ◽  
Klaus Pinn ◽  
Sorin Solomon
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Surface Thickness
Sign in / Sign up

Export Citation Format

Share Document