Comment on "Direct Observation of Crack-Tip Geometry of SiO2Glass by High-Resolution Electron Microscopy"

1984 ◽  
Vol 67 (11) ◽  
pp. c253-c253 ◽  
Author(s):  
Brian R. Lawn ◽  
David B. Marshall ◽  
Arthur H. Heuer
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Direct Observation ◽  
Crack Tip ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron ◽  
Crack Tip Geometry

Direct Observation of Atomic Arrangement of High-TcSuperconductor YBa2Cu3O6.74by High-Resolution Electron Microscopy

1987 ◽  
Vol 26 (Part 2, No. 7) ◽  
pp. L1071-L1073 ◽  
Author(s):  
Kenji Hiraga ◽  
Daisuke Shindo ◽  
Makoto Hirabayashi ◽  
Masae Kikuchi ◽  
Katsuyoshi Oh-ishi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Direct Observation ◽  
High Resolution Electron Microscopy ◽  
Atomic Arrangement ◽  
Resolution Electron
Sign in / Sign up

Export Citation Format

Share Document