Direct Observation of Atomic Arrangement of High-TcSuperconductor YBa2Cu3O6.74by High-Resolution Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.26.l1071 ◽

1987 ◽

Vol 26 (Part 2, No. 7) ◽

pp. L1071-L1073 ◽

Author(s):

Kenji Hiraga ◽

Daisuke Shindo ◽

Makoto Hirabayashi ◽

Masae Kikuchi ◽

Katsuyoshi Oh-ishi ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

High Resolution Electron Microscopy ◽

Atomic Arrangement ◽

Resolution Electron

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Direct observation of 'domain like' atomic arrangement of incommensurate 2d Au3+Zn by high-voltage-high-resolution electron microscopy

Journal of Physics C Solid State Physics ◽

10.1088/0022-3719/14/31/002 ◽

1981 ◽

Vol 14 (31) ◽

pp. L933-L938 ◽

Author(s):

O Terasaki

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

High Voltage ◽

High Resolution Electron Microscopy ◽

Atomic Arrangement ◽

Resolution Electron

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Comment on "Direct Observation of Crack-Tip Geometry of SiO2Glass by High-Resolution Electron Microscopy"

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1984.tb19502.x ◽

1984 ◽

Vol 67 (11) ◽

pp. c253-c253 ◽

Author(s):

Brian R. Lawn ◽

David B. Marshall ◽

Arthur H. Heuer

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

Crack Tip ◽

High Resolution Electron Microscopy ◽

Resolution Electron ◽

Crack Tip Geometry

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Direct observation of domain structures and interface dislocations in M7C3by high-resolution electron microscopy

Philosophical Magazine A ◽

10.1080/01418619108205586 ◽

1991 ◽

Vol 63 (6) ◽

pp. 1327-1333 ◽

Author(s):

A. Q. He ◽

H. Q. Ye ◽

G. Van Tendeloo ◽

K. H. Kuo

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

High Resolution Electron Microscopy ◽

Domain Structures ◽

Resolution Electron

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Direct Observation of Crack Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1984.tb19748.x ◽

2006 ◽

Vol 67 (3) ◽

pp. C-36-C-37 ◽

Author(s):

Yoshio Bando ◽

Setsuro Ito ◽

Minoru Tomozawa

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

Crack Tip ◽

High Resolution Electron Microscopy ◽

Resolution Electron ◽

Crack Tip Geometry

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Direct observation of the structural pattern in strip-chain silicates by high-resolution electron microscopy

International Geology Review ◽

10.1080/00206818209452432 ◽

1982 ◽

Vol 24 (4) ◽

pp. 481-488

Author(s):

V. A. Drits ◽

N. D. Zakharov ◽

I. P. Khadzhi

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

High Resolution Electron Microscopy ◽

Structural Pattern ◽

Resolution Electron

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Direct observation of rough-smooth twin structure in silver halides by high-resolution electron microscopy

Physical Review B ◽

10.1103/physrevb.53.9 ◽

1996 ◽

Vol 53 (1) ◽

pp. 9-11 ◽

Author(s):

Seshadri Jagannathan ◽

S. Chen ◽

R. V. Mehta ◽

R. Jagannathan

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

High Resolution Electron Microscopy ◽

Silver Halides ◽

Twin Structure ◽

Resolution Electron

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Direct Observation of Oxygen Vacancy in Mullite, 1.86Al2O3•SiO2 by High Resolution Electron Microscopy

Proceedings of the Japan Academy ◽

10.2183/pjab1945.51.173 ◽

1975 ◽

Vol 51 (3) ◽

pp. 173-178 ◽

Author(s):

Yoshiharu NAKAJIMA ◽

Nobuo MORIMOTO ◽

Eiichi WATANABE

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Oxygen Vacancy ◽

Direct Observation ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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Further Comment on "Direct Observation of Crack-Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy"

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1985.tb11536.x ◽

1985 ◽

Vol 68 (10) ◽

pp. C-288-C-289 ◽

Author(s):

N. H. Macmillan

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

Crack Tip ◽

High Resolution Electron Microscopy ◽

Resolution Electron ◽

Crack Tip Geometry

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Direct observation of hexagonal boron nitride at the grain boundary of cubic boron nitride by high resolution electron microscopy

Applied Physics Letters ◽

10.1063/1.113142 ◽

1995 ◽

Vol 66 (19) ◽

pp. 2490-2492 ◽

Author(s):

Wei‐Lie Zhou ◽

Yuichi Ikuhara ◽

Masao Murakawa ◽

Syuichi Watanabe ◽

Tetsuya Suzuki

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Boron Nitride ◽

Grain Boundary ◽

Direct Observation ◽

Hexagonal Boron Nitride ◽

Cubic Boron Nitride ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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Direct observation of point defects in Nb12O29by high-resolution electron microscopy

Acta Crystallographica Section A ◽

10.1107/s0567739473001610 ◽

1973 ◽

Vol 29 (6) ◽

pp. 632-636 ◽

Author(s):

S. Iijima ◽

S. Kimura ◽

M. Goto

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Direct Observation ◽

Point Defects ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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