Direct Observation of Crack Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy

2006 ◽  
Vol 67 (3) ◽  
pp. C-36-C-37 ◽  
Author(s):  
Yoshio Bando ◽  
Setsuro Ito ◽  
Minoru Tomozawa
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Direct Observation ◽  
Crack Tip ◽  
High Resolution Electron Microscopy ◽  
Sio2 Glass ◽  
Resolution Electron ◽  
Crack Tip Geometry

Direct Observation of Atomic Arrangement of High-TcSuperconductor YBa2Cu3O6.74by High-Resolution Electron Microscopy

1987 ◽  
Vol 26 (Part 2, No. 7) ◽  
pp. L1071-L1073 ◽  
Author(s):  
Kenji Hiraga ◽  
Daisuke Shindo ◽  
Makoto Hirabayashi ◽  
Masae Kikuchi ◽  
Katsuyoshi Oh-ishi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Direct Observation ◽  
High Resolution Electron Microscopy ◽  
Atomic Arrangement ◽  
Resolution Electron
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