The Characterization of N Interstitials and Dangling Bond Point Defects on Ion-Implanted GaN Nanowires Studied by Photoluminescence and X-Ray Absorption Spectroscopy

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Jau-Wern Chiou ◽  
Jin-Ming Chen ◽  
Jyh-Fu Lee ◽  
Alain Braud ◽  
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Ungkil Kim ◽  
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