Theoretical model and experimental study on environmental dissipation mechanism of tapping mode atomic force microscope

2021 ◽  
Author(s):  
Zheng Wei ◽  
Jing Liu ◽  
Ruihua Wei ◽  
Anjie Peng
Keyword(s):  
Experimental Study ◽  
Theoretical Model ◽  
Atomic Force Microscope ◽  
Tapping Mode ◽  
Atomic Force ◽  
Dissipation Mechanism

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

scholarly journals Control of an Impacted Cantilever toward Application of an Atomic Force Microscope in Tapping Mode

2008 ◽  
Vol 74 (742) ◽  
pp. 1409-1415
Author(s):  
Masatoshi NUMATSU ◽  
Andrew J. DICK ◽  
Hiroshi YABUNO ◽  
Masaharu KURODA ◽  
Balakumar BALACHANDRAN
Keyword(s):  
Atomic Force Microscope ◽  
Tapping Mode ◽  
Atomic Force

scholarly journals Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope

2014 ◽  
Vol 25 (6) ◽  
pp. 732-740 ◽  
Author(s):  
Kleber dos Santos Rodrigues ◽  
José Manoel Balthazar ◽  
Angelo Marcelo Tusset ◽  
Bento Rodrigues de Pontes ◽  
Átila Madureira Bueno
Keyword(s):  
Atomic Force Microscope ◽  
Chaotic Motion ◽  
Tapping Mode ◽  
Atomic Force

DYNAMICAL STUDY OF A PIECEWISE-SMOOTH MODEL IN TAPPING MODE ATOMIC FORCE MICROSCOPE

2011 ◽  
Author(s):  
Kleber dos Santos Rodrigues ◽  
José Manoel Balthazar ◽  
Angelo Marcelo Tusset ◽  
Bento Rodrigues de Pontes Junior
Keyword(s):  
Atomic Force Microscope ◽  
Piecewise Smooth ◽  
Dynamical Study ◽  
Tapping Mode ◽  
Atomic Force ◽  
Smooth Model

Imaging bandwidth of the tapping mode atomic force microscope probe

2006 ◽  
Vol 73 (15) ◽  
Author(s):  
János Kokavecz ◽  
Othmar Marti ◽  
Péter Heszler ◽  
Ádám Mechler
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Tapping Mode ◽  
Atomic Force ◽  
Microscope Probe
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