The use of autorefractors using the image‐size principle in determining on‐axis and off‐axis refraction. Part 2: Theoretical study of peripheral refraction with the Grand Seiko AutoRef/Keratometer WAM‐5500
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1997 ◽
Vol 392
(1)
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pp. 217-221
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1981 ◽
Vol 42
(7)
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pp. 915-928
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