scholarly journals Discussion: “An Analysis of Critical Stresses and Mode of Failure of a Wire Rope” (Starkey, W. L., and Cress, H. A., 1959, ASME J. Eng. Ind., 81, pp. 307–311)

1959 ◽  
Vol 81 (4) ◽  
pp. 311
Author(s):  
W. J. Kaufman
1959 ◽  
Vol 81 (4) ◽  
pp. 307-311 ◽  
Author(s):  
W. L. Starkey ◽  
H. A. Cress

Many wire-rope manufacturers and machine designers are under the impression that the significant stress in a wire rope is the tensile stress, or possibly the stress due to tension and bending. This paper proves by mathematical analysis that by far the greatest stress in a wire rope results from Hertz contact stresses at points of contact of wire-on-wire, and asserts that the usual mode of failure of a wire rope is fretting-fatigue initiated at such points of contact. Design relationships based on these concepts should be of great value to designers who use wire rope.


2000 ◽  
Vol 68 (3) ◽  
pp. 432-440 ◽  
Author(s):  
K. Kumar ◽  
J. Botsis

First, an attempt is made to experimentally test the validity of the linear deformation derivative results earlier developed for the multilayered wire-rope strands under tension and torsion. The theoretical results are next utilized to obtain analytical expressions for the maximum contact stresses induced in the multilayered strands with metallic wire core. These closed-form solutions provide some useful design insights into the influence of several important cable parameters and material properties on the resulting contact stresses. The strong influence of the material modulus of elasticity on the critical stresses is highlighted. Significantly, the analysis brings out how the contact stresses can rise to an order of magnitude higher levels than that of the nominal stresses.


Author(s):  
Loren Anderson ◽  
Pat Pizzo ◽  
Glen Haydon

Transmission electron microscopy of replicas has long been used to study the fracture surfaces of components which fail in service. Recently, the scanning electron microscope (SEM) has gained popularity because it allows direct examination of the fracture surface. However, the somewhat lower resolution of the SEM coupled with a restriction on the sample size has served to limit the use of this instrument in investigating in-service failures. It is the intent of this paper to show that scanning electron microscopic examination of conventional negative replicas can be a convenient and reliable technique for determining mode of failure.


1882 ◽  
Vol 13 (328supp) ◽  
pp. 5226-5228
Author(s):  
William Thomas Henney Carrington
Keyword(s):  

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