A Comparative Study of Fractographic Replicas
1974 ◽
Vol 32
◽
pp. 566-567
Keyword(s):
Transmission electron microscopy of replicas has long been used to study the fracture surfaces of components which fail in service. Recently, the scanning electron microscope (SEM) has gained popularity because it allows direct examination of the fracture surface. However, the somewhat lower resolution of the SEM coupled with a restriction on the sample size has served to limit the use of this instrument in investigating in-service failures. It is the intent of this paper to show that scanning electron microscopic examination of conventional negative replicas can be a convenient and reliable technique for determining mode of failure.
1982 ◽
Vol 28
(10)
◽
pp. 1119-1126
◽
1984 ◽
Vol 42
◽
pp. 40-41
1982 ◽
Vol 91
(6)
◽
pp. 612-614
◽
1974 ◽
Vol 32
◽
pp. 10-11
1973 ◽
Vol 31
◽
pp. 622-623
1970 ◽
Vol 26
(7)
◽
pp. 801-803
◽
1988 ◽
Vol 60
(4)
◽
pp. 451-458
◽