Thermal Conductivity Measurement of Cobalt-Iron Thin Films Using the Time-Resolved Thermoreflectance Technique

2009 ◽  
Author(s):  
Taehee Jeong ◽  
Jian-Gang Zhu
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Metal Film ◽  
Conductivity Measurement ◽  
High Thermal Conductivity ◽  
Thermal Conductivity Measurement ◽  
Thermal Barrier ◽  
Si Substrate ◽  
Time Resolved ◽  
Cobalt Iron

Using the time–resolved thermoreflectance technique, the thermal conductivity of CoFe films are measured with various thicknesses and the results show a thickness-dependent thermal conductivity. In order to overcome the obstacle for the high thermal conductivity metal film measurement, a thermal barrier (SiNx) is added between the metal film and Si substrate.

Thermal Conductivity Measurement of Thermoelectric Thin Films by a Versatility-Enhanced 2ω Method

2016 ◽  
Vol 46 (5) ◽  
pp. 3089-3096 ◽  
Author(s):  
Ryo Okuhata ◽  
Kentaro Watanabe ◽  
Satoaki Ikeuchi ◽  
Akihiro Ishida ◽  
Yoshiaki Nakamura
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Conductivity Measurement ◽  
Thermal Conductivity Measurement ◽  
Thermoelectric Thin Films

scholarly journals Thermal Conductivity Measurement of Tungsten Oxide Nanoscale Thin Films

2006 ◽  
Vol 47 (8) ◽  
pp. 1894-1897 ◽  
Author(s):  
Haitao Wang ◽  
Yibin Xu ◽  
Masahiro Goto ◽  
Yoshihisa Tanaka ◽  
Masayoshi Yamazaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Tungsten Oxide ◽  
Conductivity Measurement ◽  
Thermal Conductivity Measurement
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