scholarly journals Thermal conductivity measurement at the micrometer scale of ceramics using thermoreflectance technique —High-thermal-conductivity AlN with reduced amount of grain boundary phase—

2008 ◽  
Vol 116 (1360) ◽  
pp. 1260-1264 ◽  
Author(s):  
Sang-Kee LEE ◽  
Ikuko YAMADA ◽  
Shoichi KUME ◽  
Hiromi NAKANO ◽  
Kimihito HATORI ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Grain Boundary ◽  
Conductivity Measurement ◽  
High Thermal Conductivity ◽  
Thermal Conductivity Measurement ◽  
Boundary Phase ◽  
Micrometer Scale

Thermal Conductivity Measurement of the AlN Ceramics at the Grain Scale Using Thermoreflectance Technique

2008 ◽  
Vol 403 ◽  
pp. 65-67
Author(s):  
Sang Kee Lee ◽  
Ikuko Yamada ◽  
Shoichi Kume ◽  
Hiromi Nakano ◽  
Koji Watari
Keyword(s):  
Thermal Conductivity ◽  
Grain Boundary ◽  
Conductivity Measurement ◽  
Boundary Phase ◽  
Average Value ◽  
Grain Boundary Characteristics ◽  
The Individual ◽  
Boundary Characteristics ◽  
Micrometer Scale ◽  
Thermal Conductivities

The thermal conductivity at the micrometer-scale of AlN ceramics with eliminated grain boundary phase was measured by the thermoreflectance technique with periodic heating. Thermal conductivities were ranged from 160 to 260 W/m•K and an average value of 201 W/m•K was obtained from a 22 m2 area. The variation in the thermal conductivities was related to the individual AlN grains and grain boundary characteristics.

Thermal Conductivity Measurement of Cobalt-Iron Thin Films Using the Time-Resolved Thermoreflectance Technique

2009 ◽  
Author(s):  
Taehee Jeong ◽  
Jian-Gang Zhu
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Metal Film ◽  
Conductivity Measurement ◽  
High Thermal Conductivity ◽  
Thermal Conductivity Measurement ◽  
Thermal Barrier ◽  
Si Substrate ◽  
Time Resolved ◽  
Cobalt Iron

Using the time–resolved thermoreflectance technique, the thermal conductivity of CoFe films are measured with various thicknesses and the results show a thickness-dependent thermal conductivity. In order to overcome the obstacle for the high thermal conductivity metal film measurement, a thermal barrier (SiNx) is added between the metal film and Si substrate.

Construction of a thermal conductivity measurement system for small single crystals of organic conductors

2018 ◽  
Vol 135 (5) ◽  
pp. 2831-2836 ◽  
Author(s):  
Tetsuya Nomoto ◽  
Shusaku Imajo ◽  
Satoshi Yamashita ◽  
Hiroki Akutsu ◽  
Yasuhiro Nakazawa ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Single Crystals ◽  
Measurement System ◽  
Conductivity Measurement ◽  
Organic Conductors ◽  
Thermal Conductivity Measurement
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