Crack Detection and Monitoring Using Passive Wireless Sensor

Author(s):  
Srikar Deshmukh ◽  
Irshad Mohammad ◽  
Manos Tentzeris ◽  
Terence Wu ◽  
Haiying Huang

This paper presents an antenna sensor that can detect and monitor crack remotely and passively. Since this antenna sensor does not need electric wires for power supply and data transmission, it has great potential to be implemented as large area sensor skin with high spatial resolution, simple configuration and remote-interrogation capability. The sensor fabrication, the sensor characterization procedure and the non-contact interrogation technique are presented. The experimental results demonstrated that the antenna sensor is sensitive to crack growth and can be interrogated remotely.

2013 ◽  
pp. 159-174 ◽  
Author(s):  
D. Lo Presti ◽  
D. L. Bonanno ◽  
F. Longhitano ◽  
C. Pugliatti ◽  
S. Aiello ◽  
...  

Cryogenics ◽  
1995 ◽  
Vol 35 (3) ◽  
pp. 155-160 ◽  
Author(s):  
K. Wegendt ◽  
R.P. Huebener ◽  
R. Gross ◽  
Th. Träuble ◽  
W. Geweke ◽  
...  

2017 ◽  
Vol 124 ◽  
pp. 166-173 ◽  
Author(s):  
Andreas Schütt ◽  
Stefanie Wahl ◽  
Sylke Meyer ◽  
Jens Hirsch ◽  
Dominik Lausch

2003 ◽  
Vol 41 (7) ◽  
pp. 29-33
Author(s):  
H. Kumagai ◽  
H. Iwaki ◽  
Sean Soon Leng Ong ◽  
K. Hotate

2019 ◽  
Vol 11 (12) ◽  
pp. 1409 ◽  
Author(s):  
Aaron E. Maxwell ◽  
Michael P. Strager ◽  
Timothy A. Warner ◽  
Christopher A. Ramezan ◽  
Alice N. Morgan ◽  
...  

Despite the need for quality land cover information, large-area, high spatial resolution land cover mapping has proven to be a difficult task for a variety of reasons including large data volumes, complexity of developing training and validation datasets, data availability, and heterogeneity in data and landscape conditions. We investigate the use of geographic object-based image analysis (GEOBIA), random forest (RF) machine learning, and National Agriculture Imagery Program (NAIP) orthophotography for mapping general land cover across the entire state of West Virginia, USA, an area of roughly 62,000 km2. We obtained an overall accuracy of 96.7% and a Kappa statistic of 0.886 using a combination of NAIP orthophotography and ancillary data. Despite the high overall classification accuracy, some classes were difficult to differentiate, as highlight by the low user’s and producer’s accuracies for the barren, impervious, and mixed developed classes. In contrast, forest, low vegetation, and water were generally mapped with accuracy. The inclusion of ancillary data and first- and second-order textural measures generally improved classification accuracy whereas band indices and object geometric measures were less valuable. Including super-object attributes improved the classification slightly; however, this increased the computational time and complexity. From the findings of this research and previous studies, recommendations are provided for mapping large spatial extents.


1981 ◽  
Vol 5 ◽  
Author(s):  
Robert M. Fletcher ◽  
D. Ken Wagner ◽  
G. W. Wicks ◽  
J. M. Ballantyne

ABSTRACTA technique for making rapidly-scanned, high-spatial resolution measurements of minority-carrier diffusion length is applied to the characterization of polycrystalline GaAs. Measurements on a large-grained n-type epitaxial layer show gradual variations of hole diffusion length from 0.1µm to l.lµm across the wafer as well as occasional small step changes at grain boundaries. By trading resolution for speed, the technique would be well suited to the nondestructive evaluation of large-area epitaxial layers.


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