Design and Characterization of a Real Time, Large Area, High Spatial Resolution Particle Tracker Based on Scintillating Fibers

2013 ◽  
pp. 159-174 ◽  
Author(s):  
D. Lo Presti ◽  
D. L. Bonanno ◽  
F. Longhitano ◽  
C. Pugliatti ◽  
S. Aiello ◽  
...  
Keyword(s):  
Real Time ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Large Area ◽  
Scintillating Fibers

scholarly journals Development of a Real-Time, Large Area, High Spatial Resolution Particle Tracker Based on Scintillating Fibers

2014 ◽  
Vol 2014 ◽  
pp. 1-13 ◽  
Author(s):  
D. Lo Presti ◽  
D. L. Bonanno ◽  
F. Longhitano ◽  
C. Pugliatti ◽  
S. Aiello ◽  
...  
Keyword(s):  
Cosmic Rays ◽  
Real Time ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Charged Particles ◽  
Sensitive Area ◽  
Large Area ◽  
Main Design ◽  
Design Specifications ◽  
Scintillating Fibers

The design of a detector for tracking charged particles is presented together with the characterization techniques developed to extract the main design specifications. The goals for the final detector are to achieve real-time imaging performances, a large detection area, and a high spatial resolution, particularly suitable for medical imaging applications. This paper describes the prototype of the tracker plane, which has a 20 × 20 cm2sensitive area consisting of two crossed ribbons of 500 μm square scintillating fibers. The information about the hit position extracted real-time tracker in an innovative way, using a reduced number of the read-out channels to obtain a very large detection area but with moderate costs and complexity. The performances of the tracker have been investigated usingβsources, cosmic rays, and a 62 MeV proton beam.

High-Spatial-Resolution Diffusion Length Measurements in Polycrystalline GaAs

1981 ◽  
Vol 5 ◽  
Author(s):  
Robert M. Fletcher ◽  
D. Ken Wagner ◽  
G. W. Wicks ◽  
J. M. Ballantyne
Keyword(s):  
Nondestructive Evaluation ◽  
Spatial Resolution ◽  
Minority Carrier ◽  
Diffusion Length ◽  
High Spatial Resolution ◽  
Small Step ◽  
Large Area ◽  
Minority Carrier Diffusion Length ◽  
Length Measurements

ABSTRACTA technique for making rapidly-scanned, high-spatial resolution measurements of minority-carrier diffusion length is applied to the characterization of polycrystalline GaAs. Measurements on a large-grained n-type epitaxial layer show gradual variations of hole diffusion length from 0.1µm to l.lµm across the wafer as well as occasional small step changes at grain boundaries. By trading resolution for speed, the technique would be well suited to the nondestructive evaluation of large-area epitaxial layers.

Characterization and Control of Copper CMP with Optoacoustic Metrology

2001 ◽  
Vol 671 ◽  
Author(s):  
Michael Gostein ◽  
Paul Lefevre ◽  
Alex A. Maznev ◽  
Michael Joffe
Keyword(s):  
Film Thickness ◽  
Spatial Resolution ◽  
Chemical Mechanical Polishing ◽  
High Spatial Resolution ◽  
Mechanical Polishing ◽  
Length Measurement ◽  
And Control ◽  
Non Destructive

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.

Characterization of silicon dioxide film by high spatial resolution cathodoluminescence spectroscopy

2002 ◽  
Vol 92 (12) ◽  
pp. 7153-7156 ◽  
Author(s):  
M. Yoshikawa ◽  
K. Matsuda ◽  
Y. Yamaguchi ◽  
T. Matsunobe ◽  
Y. Nagasawa ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Silicon Dioxide Film ◽  
Cathodoluminescence Spectroscopy ◽  
Dioxide Film

scholarly journals Real-time high spatial resolution dose verification in stereotactic motion adaptive arc radiotherapy

2018 ◽  
Vol 19 (4) ◽  
pp. 173-184 ◽  
Author(s):  
Mitchell Duncan ◽  
Matthew K. Newall ◽  
Vincent Caillet ◽  
Jeremy T. Booth ◽  
Paul J. Keall ◽  
...  
Keyword(s):  
Real Time ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Dose Verification

Characterization of defects in ceramics by computerized tomography with high spatial resolution

1994 ◽  
Vol 27 (2) ◽  
pp. 101-102
Author(s):  
B. Illerhaus ◽  
J. Goebbels ◽  
H. Heidt ◽  
W. Muller ◽  
Y. Onel ◽  
...  
Keyword(s):  
Computerized Tomography ◽  
Spatial Resolution ◽  
High Spatial Resolution

Characterization of V-Defects in InGaN Single-Quantum-Well Films at Nanometer Level by High Spatial Resolution Cathodoluminescence Spectroscopy

2008 ◽  
Vol 600-603 ◽  
pp. 1305-1308
Author(s):  
Masanobu Yoshikawa ◽  
Masataka Murakami ◽  
Takaya Fujita ◽  
K. Inoue ◽  
K. Matsuda ◽  
...  
Keyword(s):  
Quantum Well ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Spectral Variation ◽  
Single Quantum ◽  
Single Quantum Well ◽  
Cathodoluminescence Spectroscopy

We have measured cathodoluminescence (CL) spectra in the vicinity of V-defects in InGaN single-quantum-well(SQW) films at nanometer level, using newly developed CL apparatus (SE-SEM-CL). From spectroscopic CL measurement, it has been found that the spectra change dramatically in the vicinity of V-defects in the region of £50nm. The SE-SEM-CL has a potential to detect the CL spectral variation at spatial resolution with £50nm.

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