Ballistic electron emission microscopy studies of electron scattering in Au/GaAs Schottky diodes damaged by focused ion beam implantation

1996 ◽  
Vol 14 (2) ◽  
pp. 617 ◽  
Author(s):  
J. W. McNabb
Keyword(s):  
Electron Scattering ◽  
Electron Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Schottky Diodes ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Ion Beam Implantation ◽  
Emission Microscopy

Benchmarking β‐Ga 2 O 3 Schottky Diodes by Nanoscale Ballistic Electron Emission Microscopy

2020 ◽  
Vol 6 (3) ◽  
pp. 1901151
Author(s):  
Renato Buzio ◽  
Andrea Gerbi ◽  
Qiming He ◽  
Yuan Qin ◽  
Wenxiang Mu ◽  
...  
Keyword(s):  
Electron Emission ◽  
Schottky Diodes ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic electron emission microscopy of Schottky diodes on RF-plasma-treated silicon

1993 ◽  
Vol 70-71 ◽  
pp. 391-395 ◽  
Author(s):  
Lidia Quattropani ◽  
Katalin Solt ◽  
Philipp Niedermann ◽  
Ivan Maggio-Aprile ◽  
Øystein Fischer ◽  
...  
Keyword(s):  
Electron Emission ◽  
Schottky Diodes ◽  
Rf Plasma ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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