Reduced electron transmission in Au/GaAs diodes damaged by focused ion beam implantation studied by ballistic electron emission microscopy
1994 ◽
Vol 12
(6)
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pp. 3712
1996 ◽
Vol 14
(2)
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pp. 617
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1998 ◽
Vol 411
(1-2)
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pp. L810-L815
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2001 ◽
Vol 66
(1-2)
◽
pp. 3-51
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1992 ◽
Vol 10
(6)
◽
pp. 3112
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1998 ◽
Vol 81
(22)
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pp. 4963-4966
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