Cermets de Cu-PbI2 en couches minces: fabrication et détermination des constantes optiques

1983 ◽  
Vol 61 (4) ◽  
pp. 612-616 ◽  
Author(s):  
Jean-Marc Theriault ◽  
Germain Boivin
Keyword(s):  
Mass Concentration ◽  
Optical Constants ◽  
Evaporation Rate ◽  
Vacuum Evaporation ◽  
Index Of Refraction ◽  
Homogeneous Mixture ◽  
Lead Iodide ◽  
Low Concentration ◽  
Photometric Measurements

In this paper, we describe a method of fabrication of metal–dielectric mixtures (cermets) deposited by vacuum evaporation. Our study is mainly concerned with co-evaporated mixtures of copper and lead iodide. The stabilization of the evaporation rate of copper and lead iodide enables us to obtain a homogeneous mixture of these twø materials whose mass concentration C is determined from a previous calibration. Photometric measurements carried out on these films lead to the determination of the optical constants N (the index of refraction) and K (the coefficient of absorption). We present here the results obtained for mixtures of low concentration in copper. These results are compared with those obtained from the Maxwell–Garnett theory.

Determination of optical constants from photometric measurements

1984 ◽  
Vol 11 (3) ◽  
pp. 141-148 ◽  
Author(s):  
T.S. Eriksson ◽  
A. Hjortsberg
Keyword(s):  
Optical Constants ◽  
Photometric Measurements

scholarly journals Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus

Materials ◽  
2020 ◽  
Vol 13 (24) ◽  
pp. 5736
Author(s):  
Aaron M. Ross ◽  
Giuseppe M. Paternò ◽  
Stefano Dal Conte ◽  
Francesco Scotognella ◽  
Eugenio Cinquanta
Keyword(s):  
Optical Constants ◽  
Transition Metal Dichalcogenides ◽  
Black Phosphorus ◽  
Index Of Refraction ◽  
Refractive Indices ◽  
Complex Index ◽  
Metal Dichalcogenides ◽  
Reflectance Data ◽  
Complex Index Of Refraction

In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.

Evaluations of Diamond-Like-Carbon Film Optical Constants and Their Effects on Flying Height Determination

1996 ◽  
Vol 118 (4) ◽  
pp. 767-773 ◽  
Author(s):  
Yufeng Li ◽  
Aric Menon ◽  
Peter Goglia
Keyword(s):  
Optical Properties ◽  
Measurement Errors ◽  
Optical Constants ◽  
Carbon Film ◽  
Index Of Refraction ◽  
Least Square ◽  
Flying Height ◽  
Height Measurement ◽  
Height Determination

The accuracy in flying height determination of a film coated magnetic slider relies on the availability of accurate optical property values of each film. In view of this, the index of refraction and coefficient of extinction of carbon and underlayer films, as used on a magnetic slider, was evaluated in this study. Various thicknesses of carbon and underlayer films were coated on Al2O3-TiC substrates, and their optical properties were determined by using a variable angle spectroscopic ellipsometer at multiple angles of incidence and two optical models via reasonable range and least square methods. Then the effects of the carbon and underlayer films on flying height measurement were assessed. It was found that the optical properties of the underlayer film are strongly thickness and wavelength dependent. Therefore, the flying height measurement errors caused by incorrect treatment of the films are functions of film thickness and light wavelength.

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