Refractive index profiling of planar optical waveguides using near-field scanning optical microscopy

Author(s):  
Lisa Dhar ◽  
H. J. Lee ◽  
E. J. Laskowski ◽  
Steve K. Buratto ◽  
Chellappan Narayanan ◽  
...  
2013 ◽  
Vol 750-752 ◽  
pp. 836-839
Author(s):  
Hao Liang ◽  
Fang Xie ◽  
Yi Fa Chen ◽  
Xiao Jun Ren

A europium (III) chelating polymer film has been investigated by fluorescence spectrum, lifetime measurement, near-field scanning optical microscopy (NSOM) and m-line method. The obtained film thickness is 1.748μm and refractive index is 1.571. Near-field scanning optical microscopy shows the good surface quality of the Europium (III) chelating polymer film.


2001 ◽  
Vol 78 (1) ◽  
pp. 13-15 ◽  
Author(s):  
Satoshi Takahashi ◽  
Katsutoshi Samata ◽  
Hirokazu Muta ◽  
Shinjiro Machida ◽  
Kazuyuki Horie

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen

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