Properties of Europium (III) Chelating Polymer Film

2013 ◽  
Vol 750-752 ◽  
pp. 836-839
Author(s):  
Hao Liang ◽  
Fang Xie ◽  
Yi Fa Chen ◽  
Xiao Jun Ren
Keyword(s):  
Refractive Index ◽  
Film Thickness ◽  
Optical Microscopy ◽  
Polymer Film ◽  
Near Field ◽  
Good Surface ◽  
Chelating Polymer ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

A europium (III) chelating polymer film has been investigated by fluorescence spectrum, lifetime measurement, near-field scanning optical microscopy (NSOM) and m-line method. The obtained film thickness is 1.748μm and refractive index is 1.571. Near-field scanning optical microscopy shows the good surface quality of the Europium (III) chelating polymer film.

Refractive-index patterning using near-field scanning optical microscopy

2001 ◽  
Vol 78 (1) ◽  
pp. 13-15 ◽  
Author(s):  
Satoshi Takahashi ◽  
Katsutoshi Samata ◽  
Hirokazu Muta ◽  
Shinjiro Machida ◽  
Kazuyuki Horie
Keyword(s):  
Refractive Index ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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