Advanced x-ray systems for nondestructive inspection and contraband detection

1999 ◽  
Author(s):  
Robert A. Armistead
2014 ◽  
Vol 47 (23) ◽  
pp. 234008 ◽  
Author(s):  
Mitsuru Ueaska ◽  
Katsuhiro Dobashi ◽  
Takeshi Fujiwara ◽  
Cuixiang Pei ◽  
Wenjing Wu ◽  
...  

2021 ◽  
Vol 1016 ◽  
pp. 1240-1245
Author(s):  
Toshihiko Sasaki ◽  
Ryoji Mizuno ◽  
Shigeki Takago ◽  
Yoshihisa Mishima

Performing X-ray stress measurement by a new method called the cosα method is spreading in Japan. The cosα method is characterized in that the entire diffraction ring is used and analysed. As a result, the measurement speed is fast, and the device can be downsized. On the other hand, the conventional sin2ψ method requires precise measurement of diffracted X-rays at several X-ray incident angles, which increases the measurement time and the size of the device. In addition, since only a small part of the diffraction ring generated during the X-ray irradiation is used, some of the information on the diffraction ring cannot be used so it is a wasteful method. In 2012, cosα method equipment was released in Japan. Since then, cosα method X-ray stress measurements have been performed at more than 300 facilities. In response to this situation, the Japan Society for Nondestructive Inspection (JSNDI) together with public and private institutions established a study group on the cosα method in 2014, and examined the cosα method and its appropriate use. In this paper, we report the results of this study group.


1974 ◽  
Vol 18 ◽  
pp. 241-246
Author(s):  
T. S. Prevender ◽  
A. W. Lynch

AbstractA low energy x-ray radiography apparatus has been developed primarily for the nondestructive inspection of LiD laser fusion targets. Exposure times of 15 minutes at 6 keV have been found satisfactory for the detection of voids in nominal 100 micron diameter spheres.


2011 ◽  
Vol 133 (2) ◽  
Author(s):  
Hiroyuki Tsuritani ◽  
Toshihiko Sayama ◽  
Yoshiyuki Okamoto ◽  
Takeshi Takayanagi ◽  
Kentaro Uesugi ◽  
...  

New nondestructive inspection methods with high spatial resolution are expected to support the evaluation and enhancement of the reliability of microjoints on printed circuit boards. An X-ray microtomography system, the SP-μCT has been developed at the Super Photon ring-8 GeV (SPring-8), the largest synchrotron radiation facility in Japan. In this work, the SP-μCT was first applied to the nondestructive evaluation of thermal fatigue phenomena, namely microstructure evolution (i.e., phase growth) and microcrack propagation, appearing in actual solder microbumps of flip chip interconnects due to thermal cyclic loading. In addition, a refraction-contrast imaging technique was simultaneously applied to visualize the fatigue cracks with an actual opening of less than 100 nm. The observed specimen has a flip chip structure joined by Sn-37wt%Pb eutectic solder bumps 150 μm in diameter. Consequently, the process of phase growth and crack propagation was determined via observation of consecutive computed tomography (CT) images obtained in the same plane of the same specimen. As the thermal cycle proceeded, remarkable phase growth was clearly observed, followed by the appearance of fatigue cracks in the corners of the interfaces between the solder bump and Cu pad. Moreover, the CT images also enabled us to evaluate the fatigue lifetime of the bumps, as follows. The lifetime to fatigue crack initiation was estimated by quantifying the increase in the phase growth. The crack propagation lifetime to failure was then determined by measuring the average crack propagation rate. Such results have not been obtainable at all by X-ray CT systems for industrial use and demonstrate the possibility of nondestructive inspection by a synchrotron radiation X-ray microtomography system.


2018 ◽  
Vol 2018.27 (0) ◽  
pp. 1505
Author(s):  
Satoru Sasaki ◽  
Takeshi Fujiwara ◽  
Tatsuki Satou ◽  
Shigeru Motoyoshi ◽  
Yoshihiro Komatsu

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