Nonlinear optical characterization of silicon wafers: in-situ detection of stacking faults and external stress

Author(s):  
Juergen Reif ◽  
Thomas Schneider ◽  
Reiner P. Schmid ◽  
Dirk Wolfframm
1994 ◽  
Vol 64 (20) ◽  
pp. 2628-2630 ◽  
Author(s):  
W. M. Gibbons ◽  
R. P. Grasso ◽  
M. K. O’Brien ◽  
P. J. Shannon ◽  
S. T. Sun

1990 ◽  
Author(s):  
Antoniangelo Agnesi ◽  
Gian P. Banfi ◽  
Mauro M. Costa ◽  
Martina Ghigliazza ◽  
Giancarlo C. Reali

2018 ◽  
Vol 20 (10) ◽  
Author(s):  
Konda Srinivasa Rao ◽  
Rashid A. Ganeev ◽  
Ke Zhang ◽  
Yue Fu ◽  
Ganjaboy S. Boltaev ◽  
...  

2012 ◽  
Vol 20 (22) ◽  
pp. 24623 ◽  
Author(s):  
Gaël Latour ◽  
Jean-Philippe Echard ◽  
Marie Didier ◽  
Marie-Claire Schanne-Klein

2015 ◽  
Vol 109 (3) ◽  
pp. 37006 ◽  
Author(s):  
X. D. Zhu ◽  
Sebastian Wicklein ◽  
Felix Gunkel ◽  
Rui Xiao ◽  
Regina Dittmann

Author(s):  
Franciele Henrique ◽  
Gustavo F. B. Almeida ◽  
Jonathas P. Siqueira ◽  
Renato J. Martins ◽  
Cleber R. Mendonça

Sign in / Sign up

Export Citation Format

Share Document