Secondary-electron image profiles using bias voltage technique in deep contact hole

2001 ◽  
Author(s):  
Yeong-Uk Ko ◽  
David C. Joy ◽  
Neal T. Sullivan ◽  
Martin E. Mastovich
Keyword(s):  
Bias Voltage ◽  
Secondary Electron ◽  
Secondary Electron Image ◽  
Electron Image

Analysis on Resistance Change Mechanism of NiO-ReRAM Using Visualization Technique of Data Storage Area With Secondary Electron Image

2010 ◽  
Vol 1250 ◽  
Author(s):  
Kentaro Kinoshita ◽  
Tatsuya Makino ◽  
Yoda Takatoshi ◽  
Dobashi Kazufumi ◽  
Kishida Satoru
Keyword(s):  
Data Storage ◽  
Secondary Electron ◽  
High Resistance State ◽  
Secondary Electron Image ◽  
Resistance Change ◽  
Force Microscopy ◽  
Electron Image ◽  
Storage Area ◽  
Resistance State ◽  
Pt Films

AbstractBoth a low resistance state and a high resistance state which were written by the voltage application in a local region of NiO/Pt films by using conducting atomic force microscopy (C-AFM) were observed by using scanning electron microscope (SEM) and electron probe micro analysis (EPMA). The writing regions are distinguishable as dark areas in a secondary electron image and thus can be specified without using complicated sample fabrication process to narrow down the writing regions such as the photolithography technique. In addition, the writing regions were analyzed by using energy dispersive X-ray spectroscopy (EDS) mapping. No difference between the inside and outside of the writing regions is observed for all the mapped elements including C and Rh. Here, C and Rh are the most probable candidates for contamination which affect the secondary electron image. Therefore, our results suggested that the observed change in the contrast of the second electron image is related to the intrinsic change in the electronic state of the NiO film and a secondary electron yield is correlated to the physical properties of the film.

Nano Robotic Manipulator Positioning Accuracy Measurement By Secondary Electron Image

2021 ◽  
Author(s):  
Litao Yang ◽  
Lue Zhang ◽  
Zhi Qu ◽  
Zengsheng Li ◽  
Zhan Yang
Keyword(s):  
Secondary Electron ◽  
Robotic Manipulator ◽  
Secondary Electron Image ◽  
Positioning Accuracy ◽  
Accuracy Measurement ◽  
Electron Image

The darkening effects of secondary electron image due to superconductivity in Y1BA2CU3O7-xfilms

1992 ◽  
Vol 128 (1) ◽  
pp. 243-248 ◽  
Author(s):  
Ludmila Kokhanchik ◽  
Alexey Nikulov ◽  
Anatoly Chernykh
Keyword(s):  
Secondary Electron ◽  
Secondary Electron Image ◽  
Electron Image

An ultrastructural study of the smear layer: Comparative aspects using secondary electron image and backscattered electron image

1994 ◽  
Vol 20 (11) ◽  
pp. 531-534 ◽  
Author(s):  
Anne Dautel-Morazin ◽  
Jean-Marie Vulcain ◽  
Martine Bonnaure-Mallet
Keyword(s):  
Ultrastructural Study ◽  
Secondary Electron ◽  
Smear Layer ◽  
Secondary Electron Image ◽  
Electron Image ◽  
Backscattered Electron

Image simulation for atomic resolution secondary electron image

2012 ◽  
Vol 123 ◽  
pp. 66-73 ◽  
Author(s):  
Lijun Wu ◽  
R.F. Egerton ◽  
Yimei Zhu
Keyword(s):  
Secondary Electron ◽  
Secondary Electron Image ◽  
Atomic Resolution ◽  
Image Simulation ◽  
Electron Image

scholarly journals Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope

2018 ◽  
Vol 24 (S1) ◽  
pp. 1514-1515
Author(s):  
Kei-ichi Fukunaga ◽  
Noriaki Endo ◽  
Shuji Kawai ◽  
Takashi Suzuki ◽  
Eiji Okunishi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Potential ◽  
Secondary Electron ◽  
Secondary Electron Image ◽  
Electron Image ◽  
Voltage Scanning ◽  
Scanning Electron
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