Modeling the impact of thermal history during post-exposure bake on the lithographic performance of chemically amplified resists

Author(s):  
Mark D. Smith ◽  
Chris A. Mack ◽  
John S. Petersen
2010 ◽  
Author(s):  
Byungki Jung ◽  
Jing Sha ◽  
Florencia Paredes ◽  
Christopher K. Ober ◽  
Michael O. Thompson ◽  
...  

2011 ◽  
Author(s):  
Byungki Jung ◽  
Christopher K. Ober ◽  
Michael O. Thompson ◽  
Todd R. Younkin ◽  
Manish Chandhok

2011 ◽  
Vol 24 (5) ◽  
pp. 487-490 ◽  
Author(s):  
Byungki Jung ◽  
Manish Chandhok ◽  
Todd R. Younkin ◽  
Christopher K. Ober ◽  
Michael O. Thompson

1997 ◽  
Vol 36 (Part 1, No. 12B) ◽  
pp. 7611-7614 ◽  
Author(s):  
Yuichiro Yanagishita ◽  
Shuichi Miyata ◽  
Yuko Kaimoto ◽  
Akira Oikawa ◽  
Ei Yano ◽  
...  

1992 ◽  
Vol 32 (21) ◽  
pp. 1565-1570 ◽  
Author(s):  
O. Nalamasu ◽  
E. Reichmanis ◽  
J. E. Hanson ◽  
R. S. Kanga ◽  
L. A. Heimbrook ◽  
...  

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