Characteristics of 193 nm chemically amplified resist during post exposure bake and post exposure delay
Keyword(s):
1999 ◽
Vol 38
(Part 1, No. 12B)
◽
pp. 7094-7098
◽
Keyword(s):
2011 ◽
Vol 24
(5)
◽
pp. 487-490
◽
1997 ◽
Vol 36
(Part 1, No. 12B)
◽
pp. 7611-7614
◽
Keyword(s):
Keyword(s):