Characteristics of 193 nm chemically amplified resist during post exposure bake and post exposure delay

Author(s):  
Eun-Mi Lee ◽  
Moon-Gyu Sung ◽  
Young-Mi Lee ◽  
Young-Soo Sohn ◽  
Hye-Keun Oh
1999 ◽  
Vol 38 (Part 1, No. 12B) ◽  
pp. 7094-7098 ◽  
Author(s):  
Eun-Mi Lee ◽  
Moon-Gyu Sung ◽  
Young-Mi Lee ◽  
Young-Soo Sohn ◽  
Hye-Keun Oh

2011 ◽  
Vol 24 (5) ◽  
pp. 487-490 ◽  
Author(s):  
Byungki Jung ◽  
Manish Chandhok ◽  
Todd R. Younkin ◽  
Christopher K. Ober ◽  
Michael O. Thompson

1997 ◽  
Vol 36 (Part 1, No. 12B) ◽  
pp. 7611-7614 ◽  
Author(s):  
Yuichiro Yanagishita ◽  
Shuichi Miyata ◽  
Yuko Kaimoto ◽  
Akira Oikawa ◽  
Ei Yano ◽  
...  

2010 ◽  
Author(s):  
Byungki Jung ◽  
Jing Sha ◽  
Florencia Paredes ◽  
Christopher K. Ober ◽  
Michael O. Thompson ◽  
...  

2001 ◽  
Author(s):  
Eun-Jung Seo ◽  
Young-Soo Sohn ◽  
Heungin Bak ◽  
Hye-Keun Oh ◽  
Sang-Gyun Woo ◽  
...  

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