Fabrication and characterization of beryllium-based multilayer mirrors for soft x-rays

Author(s):  
Judith A. Ruffner ◽  
Jon M. Slaughter ◽  
Patrick A. Kearney ◽  
Charles M. Falco
2014 ◽  
Vol 307 ◽  
pp. 360-364 ◽  
Author(s):  
I.A. Kopylets ◽  
V.V. Kondratenko ◽  
E.N. Zubarev ◽  
D.L. Voronov ◽  
E.M. Gullikson ◽  
...  

2001 ◽  
Vol 72 (1) ◽  
pp. 121-124 ◽  
Author(s):  
Y.C. Lim ◽  
T. Westerwalbesloh ◽  
A. Aschentrup ◽  
O. Wehmeyer ◽  
G. Haindl ◽  
...  

1988 ◽  
Vol 27 (Part 2, No. 11) ◽  
pp. L2131-L2133 ◽  
Author(s):  
Kazuya Saitoh ◽  
Konosuke Inagawa ◽  
Kazutake Kohra ◽  
Chikara Hayashi ◽  
Atsuo Iida ◽  
...  

2014 ◽  
Author(s):  
Franck Delmotte ◽  
Charles Bourassin-Bouchet ◽  
Sébastien de Rossi ◽  
Evgueni Meltchakov ◽  
Angelo Giglia ◽  
...  

2013 ◽  
Vol 20 (3) ◽  
pp. 449-454 ◽  
Author(s):  
Hui Jiang ◽  
Zhanshan Wang ◽  
Jingtao Zhu

B4C-based multilayers have important applications for soft to hard X-rays. In this paper, X-ray grazing-incidence reflectivity and diffuse scattering, combining various analysis methods, were used to characterize the structure of B4C-based multilayers including layer thickness, density, interfacial roughness, interdiffusion, correlation length,etc.Quantitative results for W/B4C, Mo/B4C and La/B4C multilayers were compared. W/B4C multilayers show the sharpest interfaces and most stable structures. The roughness replications of La/B4C and Mo/B4C multilayers are not strong, and oxidations and structure expansions are found in the aging process. This work provides guidance for future fabrication and characterization of B4C-based multilayers.


2000 ◽  
Author(s):  
Zhanshan Wang ◽  
Changjun Kun ◽  
Yueying Ma ◽  
Bin Chen ◽  
Jianlin Cao ◽  
...  

Author(s):  
L. T. Germinario

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.


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