Optical Field: Plane Wave

Keyword(s):  
2020 ◽  
Vol 68 (8) ◽  
pp. 6214-6225 ◽  
Author(s):  
Hailiang Wei ◽  
Yanming Liu ◽  
Lei Shi ◽  
Bo Yao ◽  
Xiaoping Li

2009 ◽  
Vol 94 (4) ◽  
pp. 044107 ◽  
Author(s):  
Y. G. Ma ◽  
P. Wang ◽  
X. Chen ◽  
C. K. Ong

Author(s):  
Jian Xu ◽  
Kean Chen ◽  
Lei Wang ◽  
Yazhou Zhang

The optimization of secondary source configuration for an active noise control (ANC) system in its enclosed space generally focuses on noise reduction requirements at discrete points only. This may lead to the poor noise reduction performance in the whole spatial region, and it is necessary to know the information on error sensor positions in advance. To address this problem, a cost function for spatial-region-oriented noise reduction is proposed. The plane wave decomposition of the enclosed sound field is used to obtain the primary field plane waves and the unit secondary field plane wave of each candidate secondary source as the prior knowledge for configuration optimization, so as to formulate a wave-domain ANC cost function. The optimization method adopts the simulated annealing search. Taking a rigid-walled rectangular cavity as an example, the optimization method is firstly compared with two space-domain methods by using analytic values of the wave-domain prior knowledge. The comparison results show that the better reduction of spatial acoustic potential energy can be achieved independent of the error sensor configuration information. Then the estimated values of the wave-domain prior knowledge through measuring randomly distributed microphones are used to optimize the configuration of the ANC system. The optimization results suggest that the noise reduction of spatial acoustic potential energy of the optimized configuration can be better than that of the space-domain method, but the microphone positions have a great influence on the noise reduction performance.


1972 ◽  
Vol 6 (2) ◽  
pp. 115-118 ◽  
Author(s):  
George C. Sherman ◽  
A.J. Devaney ◽  
L. Mandel
Keyword(s):  

Author(s):  
J. M. Pankratz

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).


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