SU-E-I-99: An Ultra-High Resolution Small Field-Of-View Solid State X-Ray Imaging Detector Based on an Electron Multiplying CCD

2012 ◽  
Vol 39 (6Part5) ◽  
pp. 3647-3648
Author(s):  
V Singh ◽  
B Loughran ◽  
A Jain ◽  
P Sharma ◽  
D Bednarek ◽  
...  
1994 ◽  
Vol 144 ◽  
pp. 593-596
Author(s):  
O. Bouchard ◽  
S. Koutchmy ◽  
L. November ◽  
J.-C. Vial ◽  
J. B. Zirker

AbstractWe present the results of the analysis of a movie taken over a small field of view in the intermediate corona at a spatial resolution of 0.5“, a temporal resolution of 1 s and a spectral passband of 7 nm. These CCD observations were made at the prime focus of the 3.6 m aperture CFHT telescope during the 1991 total solar eclipse.


2014 ◽  
Vol 898 ◽  
pp. 614-617
Author(s):  
Rui Hong Li ◽  
Yue Ping Han

The present paper reviews the X-ray grating imaging systems at home and abroad from the aspects of technological characterizations and the newest researching focus. First, not only the imaging principles and the frameworks of the typical X-ray grating imaging system based on Talbot-Lau interferometry method, but also the algorithms of retrieving the signals of attenuation, refraction and small-angle scattering are introduced. Second, the system optimizing methods are discussed, which involves mainly the relaxing the requirement of high positioning resolution and strict circumstances for gratings and designing large field of view with high resolution. Third, two and four-dimensional grating-based X-ray imaging techniques are introduced.


2006 ◽  
Vol 18 (6) ◽  
pp. 787-794
Author(s):  
Xiaodong Tao ◽  
◽  
Hyungsuck Cho ◽  
Youngjun Cho ◽  

Vision techniques used in automatic microassembly are limited by inherent problems such as small depth of focus and small field of view. Microassembly must, however, initially detect microparts in a wide field of view and large depth of field while maintaining high resolution. We propose microassembly using active zooming that can overcome these limitations. For a small field of view, active zooming prevents the target from getting out of the field of view during microassembly. For a small depth of focus, our proposal is based on focus measure to maintain clear target image in the field of view during microassembly. Two-step assembly thus ensures zoom microscopy maintaining a wide field of view and large depth of field initially and high resolution at the end. Peg-in-hole assembly experiments confirmed the feasibility of our proposal.


1992 ◽  
Author(s):  
Bernard Munier ◽  
Pascal Prieur-Drevon ◽  
G. Roziere ◽  
Jean Chabbal

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