Method for making a thin film magnetic head

1990 ◽  
Vol 87 (4) ◽  
pp. 1836-1836
Author(s):  
Hirotsugu Fukuoka
Keyword(s):  
Thin Film ◽  
Magnetic Head

scholarly journals Output Characteristics of a Thin-Film Piezoelectric AE Sensor for Magnetic Head-Disk Interaction

1997 ◽  
Vol 40 (1) ◽  
pp. 33-41 ◽  
Author(s):  
Satomitsu IMAI ◽  
G.J. BURGER ◽  
T.S.J. LAMMERINK ◽  
J.H.J. FLUITMAN
Keyword(s):  
Thin Film ◽  
Magnetic Head ◽  
Output Characteristics

scholarly journals Corrosion and Its Prevention of Thin Film Magnetic Head

2000 ◽  
Vol 49 (11) ◽  
pp. 664-668
Author(s):  
Kenya Ohashi
Keyword(s):  
Thin Film ◽  
Magnetic Head

Effect of Pole-Tip Shape on Recording Characteristics with Thin Film Magnetic Head

1985 ◽  
Vol 1 (6) ◽  
pp. 713-714
Author(s):  
T. Koshikawa ◽  
H. Kanai ◽  
A. Kakehi
Keyword(s):  
Thin Film ◽  
Magnetic Head

Ion Milling Machine for Thin Film Magnetic Head Fabrication

1988 ◽  
Vol 3 (9) ◽  
pp. 654-665
Author(s):  
Y. Ono ◽  
T. Kurosawa ◽  
Y. Hakamata ◽  
T. Sato
Keyword(s):  
Thin Film ◽  
Milling Machine ◽  
Magnetic Head ◽  
Ion Milling

Thin film magnetic head composed of inorganic materials

2005 ◽  
Author(s):  
H. Yoshimizu ◽  
W. Fujisawa ◽  
S. Orihara ◽  
K. Oguri
Keyword(s):  
Thin Film ◽  
Inorganic Materials ◽  
Magnetic Head

Magnetic head with mechanically isolated thin film sensor

1979 ◽  
Vol 65 (6) ◽  
pp. 1613-1613
Author(s):  
Charles R. Moeller ◽  
Frederick J. Jeffers
Keyword(s):  
Thin Film ◽  
Magnetic Head ◽  
Film Sensor ◽  
Thin Film Sensor

Thin film magnetic head for high definition VCR

1991 ◽  
Vol 27 (6) ◽  
pp. 4948-4950 ◽  
Author(s):  
M. Miura ◽  
M. Saito ◽  
N. Arai ◽  
K. Konishi ◽  
H.O. Nagatomo ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Head ◽  
High Definition

scholarly journals Sputtered CrN Films for Coating Material on a Thin Film Magnetic Head.

1995 ◽  
Vol 19 (2) ◽  
pp. 357-360 ◽  
Author(s):  
S. Nasu ◽  
H. Ryonai ◽  
K. Nakamura
Keyword(s):  
Thin Film ◽  
Coating Material ◽  
Magnetic Head

Topography studies of magnetic-head pole-tip areas using atomic-force microprobe

1994 ◽  
Vol 52 ◽  
pp. 540-541
Author(s):  
Nina Veisfeld
Keyword(s):  
Thin Film ◽  
Magnetic Head ◽  
Force Microscopy ◽  
Surrounding Matrix ◽  
Area Of Interest ◽  
Atomic Force ◽  
Afm Analysis ◽  
Sputter Deposited ◽  
Critical Regions ◽  
Pole Tip Recession

Atomic Force Microscopy (AFM) has made it possible to quantify an important phenomenon regarding magnetic head characterization, known as pole tip recession. The pole tip area of thin film magnetic heads, considered one of the critical regions in the head/disk interaction, became the subject of increasing concern within the past several years because of the rapid decrease of the flying heights (typical present values are ∽300 Å). The area of interest includes plated permalloy pole tips and the surrounding alumina matrix, sputter deposited onto a ceramic substrate. The complex topography of thearea is associated with the hardness differences between the materials in multiple layers compsiring the head.AFM analysis revealed significant variations in the topography of different thin film heads. Figure 1 presents a typical example of the pole tip area topography. In this AFM image the two pole tips are elevated above the surrounding matrix. A dark area above the upper pole (recessed by ∽190Å vs. the poles) and slightly brighter (elevated by ∽160Å) symmetrically positioned areas on both sides of the poles are clearly outlined.

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