Thin film magnetic head having magnetic layers of different thickness and manufacturing method therefor

1987 ◽  
Vol 82 (5) ◽  
pp. 1871-1871
Author(s):  
Masaki Ohura ◽  
Makoto Saito
1996 ◽  
Vol 451 ◽  
Author(s):  
Gerald S. Frankel

ABSTRACTCorrosion of thin film structures commonly used in electronic and magnetic devices is discussed. Typical failure modes are presented, and galvanic corrosion is discussed in some detail since it is one common problem with such devices. A graphical explanation for the determination of the ohmic potential drop during galvanic corrosion is presented. The corrosion problem of thin film disks is shown to have changed during the past ten years owing to changes in disk structure. The corrosion susceptibility of two antiferromagnetic alloys used for exchange coupling to soft magnetic layers is discussed.


Author(s):  
Satomitsu IMAI ◽  
G.J. BURGER ◽  
T.S.J. LAMMERINK ◽  
J.H.J. FLUITMAN

2010 ◽  
Vol 108 (11) ◽  
pp. 114103 ◽  
Author(s):  
Xin-Yi Wen ◽  
Jun Yu ◽  
Yun-Bo Wang ◽  
Wen-Li Zhou ◽  
Jun-Xiong Gao

2000 ◽  
Vol 49 (11) ◽  
pp. 664-668
Author(s):  
Kenya Ohashi
Keyword(s):  

2019 ◽  
Vol 17 (10) ◽  
pp. 804-806 ◽  
Author(s):  
Ankit Kumar Vishwakarma ◽  
Nitish Kumar Yadav ◽  
Lallan Yadava

In recent years, significant interest has been shown in the design and development of sensing devices which can be used to identify toxic, combustible gases and organic vapors. The detection of air pollutants such as hydrocarbons, which often has to face in everyday life, is the necessity of mankind. In the present study, undoped and the CdS-doped titanium dioxide (CdS–TiO2) thin film has been fabricated on the glass substrate by the thermal evaporation method using High Hind Vacuum coating unit model number 12 A4D. The several samples of different thickness lie in rang (450 μm to 500 μm) were fabricated. The sensing properties of fabricated CdS-doped TiO2 thin film were examined for toluene gas at room temperature (300 K). The response and recovery time of the sensor were measured varying the concentration of toluene (0–5000 ppm) in air ambient and it is 22 for undoped TiO2 and 38 for CdS–TiO2 thin film. The response and recovery time of the sensors is the 70 s and 125 s for exposed toluene gas at room temperature. We observed that the fabricated CdS–TiO2 thin film is a suitable detector for detection of toluene gas at room temperature.


1985 ◽  
Vol 1 (6) ◽  
pp. 713-714
Author(s):  
T. Koshikawa ◽  
H. Kanai ◽  
A. Kakehi
Keyword(s):  

1988 ◽  
Vol 3 (9) ◽  
pp. 654-665
Author(s):  
Y. Ono ◽  
T. Kurosawa ◽  
Y. Hakamata ◽  
T. Sato

1990 ◽  
Vol 87 (4) ◽  
pp. 1836-1836
Author(s):  
Hirotsugu Fukuoka
Keyword(s):  

1991 ◽  
Vol 232 ◽  
Author(s):  
Tadashi Yogi ◽  
Thao A. Nguyena ◽  
Steven E. Lambert ◽  
Grace L. Gorman ◽  
Gil Castillo

ABSTRACTThe magnetic and recording characteristics of Co-based thin film media are strongly influenced by microstructure. The media microstructural characteristics, in turn, depend on sputtering conditions of underlayers and magnetic layers. The role of Cr underlayer thickness and sputtering pressure have been reported previously. The present work examines the growth morphology and recording properties of a CoPtCr alloy on Cr underlayers where the deposition conditions such as sputtering pressure and rf bias were independently varied for the Cr underlayer and the magnetic layer. We find that the growth morphology of the magnetic layer is governed primarily by the deposition condition of the Cr underlayer. In particular, increased sputtering pressure for the Cr underlayer produces columnar morphology which induces isolation of the grains in the magnetic layer. This results in a significant reduction in the recording noise due to reduced intergrain exchange coupling. On the other hand, the application of ff bias during the deposition of the magnetic layer promotes more continuous magnetic grains, thereby increasing the recording noise. The observed trends in microstructure and recording noise can be understood qualitatively in terms of Thornton's microstructure diagram and the competition between micromorphological roughness and adatom mobility during the film growth.


Author(s):  
H. Yoshimizu ◽  
W. Fujisawa ◽  
S. Orihara ◽  
K. Oguri

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