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X-ray Diffraction Study of the Effect of Neutron Irradiation on the Defect Formation in Silicon Crystals Grown by the Czochralski Method and Annealed at High Temperatures
Physics of the Solid State
◽
10.1134/1.2087738
◽
2005
◽
Vol 47
(10)
◽
pp. 1863
Author(s):
V. A. Makara
Keyword(s):
Diffraction Study
◽
High Temperatures
◽
Neutron Irradiation
◽
Defect Formation
◽
Czochralski Method
◽
X Ray Diffraction
◽
X Ray
◽
Silicon Crystals
Download Full-text
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In situ X-ray diffraction study of the phase transition from graphite to hexagonal diamond under high pressures and high temperatures
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◽
1994
◽
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◽
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◽
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X-Ray Diffraction Study of Transition Metals After Fast Neutron Irradiation at Low Temperature
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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Influence of neutron irradiation on the microstructure of nuclear graphite: An X-ray diffraction study
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◽
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