A Method for Calculating of Нeating Closed High-Current Electric Contacts by Pulsed Currents
2013 ◽
Vol 49
(5)
◽
pp. 433-439
◽
2010 ◽
Vol 165
◽
pp. 130-135
◽
1988 ◽
Vol 46
◽
pp. 474-475
Defect reduction in oxygen implanted silicon-on-insulator material during high-temperature annealing
1989 ◽
Vol 47
◽
pp. 604-605
1979 ◽
Vol 40
(C7)
◽
pp. C7-303-C7-304
1979 ◽
Vol 40
(C7)
◽
pp. C7-281-C7-282
1979 ◽
Vol 129
(9)
◽
pp. 87
◽
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