Interaction of electromagnetic radiation with a thin metal wire in the case of a glancing incident wave

2017 ◽  
Vol 62 (3) ◽  
pp. 205-211 ◽  
Author(s):  
N. G. Kokodii ◽  
M. V. Kaidash ◽  
V. A. Timaniuk ◽  
I. A. Priz
2014 ◽  
Vol 2014 (0) ◽  
pp. 107-108
Author(s):  
Naoki Maeda ◽  
Tomohisa Tanaka ◽  
Jiang Zhu ◽  
Yoshio Saito

1979 ◽  
Vol 20 (12) ◽  
pp. 5100-5103
Author(s):  
J. W. Cook ◽  
M. J. Skove ◽  
E. P. Stillwell

Author(s):  
Dongmin Wu ◽  
Nicholas Fang ◽  
Cheng Sun ◽  
Xiang Zhang ◽  
Willie J. Padilla ◽  
...  

Micro-structured materials, which contain engineered subwavelength components, can be designed to have positive or negative ε and μ at desired frequency. In this paper, we demonstrate a high pass Terahertz (THz) filter which utilizes the lowered plasma frequency of thin metal wire structures. This high pass filter may have applications in the THz imaging systems. The filter is formed by two-dimensional cubic lattice of thin metal wires. The diameter of the wire is 30 μm, the lattice constant is 120 μm, and the length of the wire is 1mm. Micro-stereolithography technique is applied to fabricate this high aspect ratio cylinders. The reflection property of the filter is characterized by Fourier transform infrared (FTIR) spectroscopy, and a plasma frequency at 0.7 THz is observed, which agrees with the approximate theory.


Author(s):  
J. Bentley ◽  
E. A. Kenik

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.


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