Differential Regulation of BBC3/PUMA and PMAIP1/Noxa in Ionizing Radiation: the Role of p53

2021 ◽  
Vol 15 (6) ◽  
pp. 544-553
Author(s):  
O. A. Kuchur ◽  
P. D. Kuchur ◽  
D. O. Kuzmina ◽  
A. V. Zavirsky ◽  
A. A. Shtil
2021 ◽  
Vol 7 (1) ◽  
Author(s):  
You-Chul Jung ◽  
Mi-Ae Lee ◽  
Han-Shin Kim ◽  
Kyu-Ho Lee

AbstractBiofilm formation of Vibrio vulnificus is initiated by adherence of flagellated cells to surfaces, and then flagellum-driven motility is not necessary during biofilm maturation. Once matured biofilms are constructed, cells become flagellated and swim to disperse from biofilms. As a consequence, timely regulations of the flagellar components’ expression are crucial to complete a biofilm life-cycle. In this study, we demonstrated that flagellins’ production is regulated in a biofilm stage-specific manner, via activities of a protease DegQ and a chaperone FlaJ. Among four flagellin subunits for V. vulnificus filament, FlaC had the highest affinities to hook-associated proteins, and is critical for maturating flagellum, showed the least susceptibility to DegQ due to the presence of methionine residues in its DegQ-sensitive domains, ND1 and CD0. Therefore, differential regulation by DegQ and FlaJ controls the cytoplasmic stability of flagellins, which further determines the motility-dependent, stage-specific development of biofilms.


PLoS ONE ◽  
2014 ◽  
Vol 9 (5) ◽  
pp. e97599 ◽  
Author(s):  
Ujjal Das ◽  
Krishnendu Manna ◽  
Mahuya Sinha ◽  
Sanjukta Datta ◽  
Dipesh Kr Das ◽  
...  

2018 ◽  
Vol 34 (2) ◽  
pp. 123-130 ◽  
Author(s):  
Shereen M. Shedid ◽  
Nadia Abdel-Magied ◽  
Helen N. Saada

2010 ◽  
pp. OR22-4-OR22-4
Author(s):  
Rabii Ameziane-El-Hassani ◽  
Myriem Boufraqech ◽  
Odile Lagente-Chevallier ◽  
Urbain Weyemi ◽  
Monique Talbot ◽  
...  

2014 ◽  
Vol 29 (2) ◽  
pp. 116-122 ◽  
Author(s):  
Marija Obrenovic ◽  
Djordje Lazarevic ◽  
Edin Dolicanin ◽  
Milos Vujisic

This paper deals with the flash memory reliability in terms of the ionizing radiation effects. In fact, the reliability of flash memory depends on physico-chemical restrictions of electrostatic nature due to the effects of ionizing radiation. The presented results are actual as a high degree of integrated components miniaturization affects the memory sensitivity, while the role of memories in the solar cells management system for space flights is increasing, so that the effects of ionizing radiation may cause changes in the stored data or the physical destruction of the flash memory components.


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