Transmission electron microscopy characterization of the microstructure of Cd3As2 films prepared by pulsed-laser evaporation

Transmission electron microscopy with an analytical X-ray system has been used to investigate Cd3As2 films prepared by pulsed-laser evaporation. The films were deposited on amorphous substrates at ~ 120 °C. They consisted mainly of a fine polycrystalline array. The crystal structure was identified as the body-centered tetragonal form of Cd3As2. No other crystallographic phase of Cd3As2 was observed. Some regions with amorphous or eutectic inclusions were also observed. These results have been correlated with the electrical properties of pulsed-laser evaporated Cd3As2 films.