OPTIMAL PARALLEL ENCODING AND DECODING ALGORITHMS FOR TREES

1992 ◽  
Vol 03 (01) ◽  
pp. 1-10 ◽  
Author(s):  
STEPHAN OLARIU ◽  
JAMES L. SCHWING ◽  
JINGYUAN ZHANG

Encoding the shape of a binary tree is a basic step in a number of algorithms in integrated circuit design, automated theorem proving, and game playing. We propose cost-optimal parallel algorithms to solve the binary tree encoding/decoding problem. Specifically, we encode the relevant shape information of an n-node binary tree in a 2n bitstring. Conversely, given an arbitrary 2n bitstring we reconstruct the shape of the corresponding binary tree, if such a tree exists. All our algorithms run in O (log n) time using O (n/log n) processors in the EREW-PRAM model of computation.

Author(s):  
Hung-Sung Lin ◽  
Ying-Chin Hou ◽  
Juimei Fu ◽  
Mong-Sheng Wu ◽  
Vincent Huang ◽  
...  

Abstract The difficulties in identifying the precise defect location and real leakage path is increasing as the integrated circuit design and process have become more and more complicated in nano scale technology node. Most of the defects causing chip leakage are detectable with only one of the FA (Failure Analysis) tools such as LCD (Liquid Crystal Detection) or PEM (Photon Emission Microscope). However, due to marginality of process-design interaction some defects are often not detectable with only one FA tool [1][2]. This paper present an example of an abnormal power consumption process-design interaction related defect which could only be detected with more advanced FA tools.


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