-ORIENTED GaAs/AlGaAs AND InGaAs/GaAs QUANTUM WELL STRUCTURES FABRICATED BY MOVPE AND THEIR OPTICAL AND STRAIN-INDUCED PIEZOELECTRIC PROPERTIES

2000 ◽  
Vol 10 (01) ◽  
pp. 93-101
Author(s):  
SOOHAENG CHO ◽  
A. SANZ-HERVÁS ◽  
JONGSEOK KIM ◽  
A. MAJERFELD ◽  
B. W. KIM

We report our recent results on the growth and properties of GaAs/AlGaAs and strained InGaAs/GaAs quantum well (QW) structures grown on (111)A GaAs substrates by atmospheric-pressure metalorganic vapor phase epitaxy. We have fabricated 25-period GaAs/AlGaAs multiquantum well structures with good crystal quality, high photoluminescence (PL) emission intensity and monolayer (ML) well width fluctuation. We also present the optical and piezoelectric properties of strained InGaAs/GaAs single quantum well structures grown on (111)A GaAs. Photoreflectance spectroscopy has been performed to analyze not only the excitonic transitions, but also the Franz-Keldysh oscillations to obtain the electric fields in the well and barriers, which are necessary to determine the actual QW potential profile and, thereby, to properly interpret the properties of the structures. A PL linewidth of 9.7 meV has been also achieved, which corresponds to a 1 ML interfacial roughness for an In0.14Ga0.86As well with a 40 Å width.

2015 ◽  
Vol 30 (9) ◽  
pp. 094016 ◽  
Author(s):  
O Donmez ◽  
A Erol ◽  
M C Arikan ◽  
H Makhloufi ◽  
A Arnoult ◽  
...  

1993 ◽  
Vol 300 ◽  
Author(s):  
S. Subramanian ◽  
B. M. Arora ◽  
A. K. Srivastava ◽  
S. Banerjee ◽  
G. Fernandes

ABSTRACTIn this paper we report a modified Kroemer's analysis for the determination of the band offset (ΔEc) of single quantum well (SQW) structures from simple C-V measurements. The experimental carrier profile from an MOVPE grown pseudomorphic GaAs/InGaAs/GaAs strained SQW structure shows a sharp accumulation peak bounded by depletion regions on either side. The full width at half maximum of the accumulation peak is comparable to the width of the quantum well. The value of ΔEC obtained from C-V measurement is in good agreement with the values determined by simulation and photoluminescence measurements. DLTS measurements on our SQW samples do not show any peaks which is contrary to the published reports. We believe that it is necessary to carefully isolate the role of interface states, before assigning a DLTS peak to emission from the quantum well.


1992 ◽  
Vol 60 (3) ◽  
pp. 365-367 ◽  
Author(s):  
H. Kawanishi ◽  
Y. Sugimoto ◽  
T. Ishikawa ◽  
H. Hidaka

1993 ◽  
Vol 8 (1S) ◽  
pp. S296-S299 ◽  
Author(s):  
R Sizmann ◽  
P Helgesen ◽  
H Steen ◽  
T Skauli ◽  
T Colin ◽  
...  

1996 ◽  
Vol 11 (8) ◽  
pp. 1185-1188 ◽  
Author(s):  
A N Baranov ◽  
Y Cuminal ◽  
G Boissier ◽  
J C Nicolas ◽  
J L Lazzari ◽  
...  

2003 ◽  
Vol 240 (2) ◽  
pp. 344-347 ◽  
Author(s):  
D. M. Graham ◽  
A. Soltani Vala ◽  
P. Dawson ◽  
M. J. Godfrey ◽  
M. J. Kappers ◽  
...  

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