Transmission Electron Microscope Observation of Grown-in Defects Detected by Bright-Field Infrared-Laser Interferometer in Czochralski Silicon Crystals

1998 ◽  
Vol 37 (Part 2, No. 2B) ◽  
pp. L196-L199 ◽  
Author(s):  
Yoichi Ikematsu ◽  
Toshiyuki Mizutani ◽  
Katsuhiko Nakai ◽  
Masanori Fujinami ◽  
Masami Hasebe ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Laser Interferometer ◽  
Infrared Laser ◽  
Electron Microscope Observation ◽  
Bright Field ◽  
Czochralski Silicon ◽  
Transmission Electron Microscope Observation ◽  
Silicon Crystals ◽  
Transmission Electron

In Situ Transmission Electron Microscope Observation of Melting of Aluminum Particles

1998 ◽  
Vol 4 (3) ◽  
pp. 264-268 ◽  
Author(s):  
S. Arai ◽  
S. Tsukimoto ◽  
H. Saka
Keyword(s):  
Electron Microscope ◽  
Liquid Phase ◽  
Transmission Electron Microscope ◽  
Microscope Observation ◽  
Crystalline Solid ◽  
Electron Microscope Observation ◽  
Aluminum Particles ◽  
Transmission Electron Microscope Observation ◽  
Transmission Electron

The processes of melting and freezing of aluminum (Al) particles have been observed directly in a transmission electron microscope. The liquid phase nucleated preferentially at the surface of an Al particle, surrounding the crystalline solid at the onset of melting. The liquid phase then propagated inside the Al particle at the expense of the solid.

scholarly journals TRANSMISSION ELECTRON MICROSCOPE, OBSERVATION ON MICROSTRUCTURE OF ELECTROLESS-PLATED DISK

1991 ◽  
Vol 7 (Supple) ◽  
pp. 1217-1220
Author(s):  
YOICHIRO FURUKAWA ◽  
TATSUO YAMANAKA ◽  
MOTOHARU FUKAZAWA ◽  
TAKUYA HAYASHI ◽  
HIROSHI TAKENO
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Microscope Observation ◽  
Electron Microscope Observation ◽  
Transmission Electron Microscope Observation ◽  
Transmission Electron
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