Quantitative Measurement of Linear and Nonlinear Dielectric Characteristics Using Scanning Nonlinear Dielectric Microscopy

2000 ◽  
Vol 39 (Part 1, No. 5B) ◽  
pp. 3086-3089 ◽  
Author(s):  
Yasuo Cho ◽  
Satoshi Kazuta ◽  
Koya Ohara ◽  
Hiroyuki Odagawa
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