Microcrystalline Silicon Prepared by Hot-Wire Chemical Vapour Deposition for Thin Film Solar Cell Applications

2002 ◽  
Vol 41 (Part 2, No. 1A/B) ◽  
pp. L10-L12 ◽  
Author(s):  
Stefan Klein ◽  
Johannes Wolff ◽  
Friedhelm Finger ◽  
Reinhard Carius ◽  
Heribert Wagner ◽  
...  
2003 ◽  
Vol 430 (1-2) ◽  
pp. 202-207 ◽  
Author(s):  
Stefan Klein ◽  
Friedhelm Finger ◽  
Reinhard Carius ◽  
Thorsten Dylla ◽  
Bernd Rech ◽  
...  

2007 ◽  
Vol 989 ◽  
Author(s):  
Hongbo Li ◽  
Ronald H.J. Franken ◽  
Robert L. Stolk ◽  
C. H.M. van der Werf ◽  
Jan-Willem A. Schuttauf ◽  
...  

AbstractThe influence of the surface roughness of Ag/ZnO coated substrates on the AM1.5 J-V characteristics of microcrystalline silicon (μc-Si:H) solar cells with an i-layer made by the hot-wire chemical vapour deposition (HWCVD) technique is discussed. Cells deposited on substrates with an intermediate rms roughness show the highest efficiency. When using reverse hydrogen profiling during i-layer deposition, an efficiency of 8.5 % was reached for single junction μc-Si:H n-i-p cells, which is the highest for μc-Si:H n-i-p cells with a hot-wire i-layer.


2000 ◽  
Vol 63 (3) ◽  
pp. 237-246 ◽  
Author(s):  
C Voz ◽  
D Peiró ◽  
M Fonrodona ◽  
D Soler ◽  
J Bertomeu ◽  
...  

2001 ◽  
Vol 395 (1-2) ◽  
pp. 305-309 ◽  
Author(s):  
Stefan Klein ◽  
Friedhelm Finger ◽  
Reinhard Carius ◽  
Heribert Wagner ◽  
Martin Stutzmann

2009 ◽  
Vol 517 (12) ◽  
pp. 3575-3577 ◽  
Author(s):  
Fernando Villar ◽  
Aldrin Antony ◽  
Jordi Escarré ◽  
Daniel Ibarz ◽  
Rubén Roldán ◽  
...  

2003 ◽  
Vol 762 ◽  
Author(s):  
Ian Y.Y. Bu ◽  
A.J. Flewitt ◽  
J Robertson ◽  
W.I. Milne

AbstractMicrocrystalline silicon deposited at low temperatures (<150°C) is a candidate material for use as the channel layer in thin film transistors deposited on plastic substrates. This would enable driver electronics to be integrated onto cheap flexible AMLCD panel.In this study microcrystalline silicon was deposited by Electron Cyclotron Resonance Plasma Enhanced chemical Vapour Deposition (ECR-PECVD) at a temperature of 80°C, compatible with most plastic such as PET and PEN. A source gas mixture of SiH4 and H2 was employed. The structural and optical properties of samples deposited under a range of deposition conditions were measured.


2006 ◽  
Vol 501 (1-2) ◽  
pp. 276-279 ◽  
Author(s):  
H. Li ◽  
R.L. Stolk ◽  
C.H.M. van der Werf ◽  
M.Y.S. Rusche ◽  
J.K. Rath ◽  
...  

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