Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Gate-Overlapped Lightly Doped Drain Thin Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 6A) ◽  
pp. 3354-3360 ◽  
Author(s):  
Tetsuo Kawakita ◽  
Hidehiro Nakagawa ◽  
Yukiharu Uraoka ◽  
Takashi Fuyuki
2003 ◽  
Vol 93 ◽  
pp. 31-36
Author(s):  
H. Nakagawa ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
Takashi Fuyuki ◽  
...  

2002 ◽  
Vol 41 (Part 2, No. 1A/B) ◽  
pp. L13-L16 ◽  
Author(s):  
Yukiharu Uraoka ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Takashi Fuyuki

2000 ◽  
Author(s):  
Y. Uraoka ◽  
T. Hatayama ◽  
T. Fuyuki ◽  
T. Kawamura ◽  
Y. Tsuchihashi

2013 ◽  
Vol 34 (5) ◽  
pp. 638-640 ◽  
Author(s):  
Tien-Yu Hsieh ◽  
Ting-Chang Chang ◽  
Yu-Te Chen ◽  
Po-Yung Liao ◽  
Te-Chih Chen ◽  
...  

2019 ◽  
Vol 50 (1) ◽  
pp. 1222-1225 ◽  
Author(s):  
Hyun-Woo Park ◽  
Jungmin Bae ◽  
Hara Kang ◽  
Dae Hwan Kim ◽  
PyongGil Jung ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document