Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device and Its Application to Complementary Metal Oxide Semiconductor Image Sensor Readout Circuit

2008 ◽  
Vol 47 (4) ◽  
pp. 2602-2605 ◽  
Author(s):  
Hochul Lee ◽  
Youngchang Yoon ◽  
Jongwook Jeon ◽  
Hyungcheol Shin
2008 ◽  
Vol 47 (7) ◽  
pp. 5390-5395 ◽  
Author(s):  
Koichi Mizobuchi ◽  
Satoru Adachi ◽  
Jose Tejada ◽  
Hiromichi Oshikubo ◽  
Nana Akahane ◽  
...  

2011 ◽  
Vol 50 (4S) ◽  
pp. 04DL04 ◽  
Author(s):  
Arata Nakajima ◽  
Toshihiko Noda ◽  
Kiyotaka Sasagawa ◽  
Takashi Tokuda ◽  
Yasuyuki Ishikawa ◽  
...  

2010 ◽  
Vol 49 (4) ◽  
pp. 04DB01 ◽  
Author(s):  
Naoya Watanabe ◽  
Isao Tsunoda ◽  
Takayuki Takao ◽  
Koichiro Tanaka ◽  
Tanemasa Asano

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