Failure Analysis of InP-Based Edge-Emitting Buried Heterostructure Laser Diodes Degraded by Forward-Biased Electrostatic Discharge Tests

2009 ◽  
Vol 48 (5) ◽  
pp. 052102 ◽  
Author(s):  
Hiroyuki Ichikawa ◽  
Shinji Matsukawa ◽  
Kotaro Hamada ◽  
Akira Yamaguchi ◽  
Takashi Nakabayashi
2009 ◽  
Vol 106 (8) ◽  
pp. 083101 ◽  
Author(s):  
Hiroyuki Ichikawa ◽  
Shinji Matsukawa ◽  
Kotaro Hamada ◽  
Nobuyuki Ikoma ◽  
Takashi Nakabayashi

1997 ◽  
Vol 3 (3) ◽  
pp. 862-873 ◽  
Author(s):  
S.N.G. Chu ◽  
T. Tanbun-Ek ◽  
A. Logan ◽  
J. Vandenberg ◽  
P.F. Sciortino ◽  
...  

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