The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal–Oxide–Semiconductor Field Effect Transistors under Dynamic Body Biases
2010 ◽
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pp. 084201
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2000 ◽
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pp. 1897-1903
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2001 ◽
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pp. 5290-5293
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pp. 04DC01
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pp. 23-31
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pp. 10PB02
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