Theoretical Studies of Disorder Scattering in Compound Semiconductor Alloys

1976 ◽  
Vol 41 (5) ◽  
pp. 1603-1610 ◽  
Author(s):  
Tatau Nishinaga ◽  
Osamu Hori ◽  
Susumu Uchiyama
Keyword(s):  
Compound Semiconductor ◽  
Theoretical Studies ◽  
Semiconductor Alloys ◽  
Disorder Scattering

Optical characterization of compound semiconductor alloys

1974 ◽  
Vol 27 ◽  
pp. 166-176
Author(s):  
A. Onton ◽  
M.R. Lorenz ◽  
J.M. Woodall ◽  
R.J. Chicotka
Keyword(s):  
Optical Characterization ◽  
Compound Semiconductor ◽  
Semiconductor Alloys

Semiconductor Alloys: Local Bond Lengths, Mixing Enthalpies, and Microclusters

1985 ◽  
Vol 46 ◽  
Author(s):  
A.B. Chen ◽  
A. Sher
Keyword(s):  
Statistical Theory ◽  
Bond Length ◽  
Local Structure ◽  
Theoretical Studies ◽  
Semiconductor Alloys ◽  
Bond Lengths ◽  
Random Alloy ◽  
Dilute Limit ◽  
Mixing Enthalpies

AbstractSeveral recent theoretical studies of the local structure of semiconductor alloys are summarized. First, dilute limit calculations of local bond lengths and mixing enthalpies are discussed. These calculations include effects due to both bond length and bondangle distortions, as well as local chemical rearrangements. Then, a new statistical theory of concentrated alloys is described. Deviations from random alloy distributions (microclusters) are predicted.

Incorporation kinetics in mixed anion compound semiconductor alloys

2013 ◽  
Vol 114 (23) ◽  
pp. 234907 ◽  
Author(s):  
Joanna M. Millunchick ◽  
Evan M. Anderson ◽  
Chris Pearson ◽  
Wendy L. Sarney ◽  
Stefan P. Svensson
Keyword(s):  
Compound Semiconductor ◽  
Semiconductor Alloys

Mechanical properties of some binary, ternary and quaternary III–V compound semiconductor alloys

2007 ◽  
Vol 392 (1-2) ◽  
pp. 51-57 ◽  
Author(s):  
R. Navamathavan ◽  
D. Arivuoli ◽  
G. Attolini ◽  
C. Pelosi ◽  
Chi Kyu Choi
Keyword(s):  
Mechanical Properties ◽  
Compound Semiconductor ◽  
Semiconductor Alloys

Sputter induced near surface electronic defects in group II–IV compound semiconductor alloys

1987 ◽  
Vol 189-190 ◽  
pp. A432
Author(s):  
H. Neff ◽  
K.Y. Lay ◽  
M.S. Su ◽  
P. Lange ◽  
K.J. Bachmann
Keyword(s):  
Compound Semiconductor ◽  
Semiconductor Alloys ◽  
Near Surface ◽  
Group Ii ◽  
Electronic Defects
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